SEMINARS AND WORKSHOPS

Date:  28th January 2023

Timing: 09:00 a.m. to 11:00 a.m.

Organised by:    MCA Department

Faculty Programme Co-ordinator: Prof. S . P. Sreeja, Sr. Assistant Professor, Department of MCA, New Horizon College of Engineering, Bengaluru.

Convenor: Dr. V. Asha, Professor & Head, Department of MCA, New Horizon College of Engineering, Bengaluru.

Participants: III Sem MCA Students

No. of participants: 90

Details of the Resource Persons:

Ms.Vidhyashree P,

Sr. Technical Lead,

Tessolve Semiconductor Pvt. Ltd., Bangalore

Profile of the Expert:

Ms. Vidhyashree P is a Sr. Technical Lead currently working in Tessolve Semiconductor. She works on various Projects like Analysing, Financing,  and currently working with semiconductor devices. She is an alumni of MCA Department, New Horizon College of Engineering passed out in 2013. She also has experience in working in various projects which is outsourced to Bank, Financial sectors etc. She has initially worked with various teams and build projects in Python, Java, etc.

Objective:

The objective of the sessions is to give an insight on Importance of Algorithm in Inspective Evaluation of  Dies on Wafer, and the testing practices.

Content:

• Introduction to Semiconductor devices
• Working of the selected ICs
• Testing Features
• Demonstration of Divide and Conquer Algorithms

Summary of Content:

Due to advances in semiconductor processing technologies, each slice of a semiconductor is becoming denser and more complex, which can increase the number of surface defects. These defects should be caught early and correctly classified in order help identify the causes of these defects in the process and eventually help to improve the yield. In today’s semiconductor industry, visible surface defects are still being inspected manually, which may result in erroneous classification when the inspectors become tired or lose objectivity.

The session started with a brief introduction about general concept of semiconductor. It was an interactive session and students came up with various queries. The demo of an application was given at the end of the session with Binary search and Mergesort algorithms, which were related to finding the defected ones.

The session ended with a few discussions about the benefits of using it in various projects. Students were benefited by this session and had a great learning experience.

Outcome:

Semiconductor devices used for inspecting the dies on wafer, and the usage of algorithms to measure the detection simultaneously. By the end of the session students learnt the basic concept of Semiconductor devices and also how to do the testing with the help of various algorithms . It will help them to just start with, by the help of various information from the references shared by the speaker.